Learn Concepts in Multiple-instance Learning with Diverse Density Framework Using Supervised Mean Shift

IEEE Computer Society
Publication Type:
Conference Proceeding
Proceedings. 2010 Digital Image Computing: Techniques and Applications (DICTA 2010), 2010, pp. 643 - 648
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Many machine learning tasks can be achieved by using Multiple-instance learning (MIL) when the target features are ambiguous. As a general MIL framework, Diverse Density (DD) provides a way to learn those ambiguous features by maxmising the DD estimator, and the maximum of DD estimator is called a concept. However, modeling and finding multiple concepts is often difficult especially without prior knowledge of concept number, i.e., every positive bag may contain multiple coexistent and heterogeneous concepts but we do not know how many concepts exist. In this work, we present a new approach to find multiple concepts of DD by using an supervised mean shift algorithm. Unlike classic mean shift (an unsupervised clustering algorithm), our approach for the first time introduces the class label to feature point and each point differently contributes the mean shift iterations according to its label and position. A feature point derives from an MIL instance and takes corresponding bag label. Our supervised mean shift starts from positive points and converges to the local maxima that are close to the positive points and far away from the negative points. Experiments qualitatively indicate that our approach has better properties than other DD methods.
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