Robust field-aligned global parametrization

Myles, A; Pietroni, N; Zorin, D

Robust field-aligned global parametrization

Myles, A Pietroni, N

Zorin, D

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Publisher:: Association for Computing Machinery
Publication Type:: Journal Article
Citation:: ACM Transactions on Graphics, 2014, 33, (4), pp. 135-135
Issue Date:: 2014

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Field	Value	Language
dc.contributor.author	Myles, A
dc.contributor.author	Pietroni, N https://orcid.org/0000-0002-8271-2102
dc.contributor.author	Zorin, D
dc.date.accessioned	2023-03-17T04:14:24Z
dc.date.available	2023-03-17T04:14:24Z
dc.date.issued	2014
dc.identifier.citation	ACM Transactions on Graphics, 2014, 33, (4), pp. 135-135
dc.identifier.issn	0730-0301
dc.identifier.issn	1557-7333
dc.identifier.uri	http://hdl.handle.net/10453/167453
dc.description.abstract	We present a robust method for computing locally bijective global parametrizations aligned with a given cross-field. The singularities of the parametrization in general agree with singularities of the field, except in a small number of cases when several additional cones need to be added in a controlled way. Parametric lines can be constrained to follow an arbitrary set of feature lines on the surface. Our method is based on constructing an initial quad patch partition using robust cross-field integral line tracing. This process is followed by an algorithm modifying the quad layout structure to ensure that consistent parametric lengths can be assigned to the edges. For most meshes, the layout modification algorithm does not add new singularities; a small number of singularities may be added to resolve an explicitly described set of layouts. We demonstrate that our algorithm succeeds on a test data set of over a hundred meshes. Copyright © ACM.
dc.language	English
dc.publisher	Association for Computing Machinery
dc.relation.ispartof	ACM Transactions on Graphics
dc.relation.isbasedon	10.1145/2601097.2601154
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject	0801 Artificial Intelligence and Image Processing, 0806 Information Systems
dc.subject.classification	Software Engineering
dc.title	Robust field-aligned global parametrization
dc.type	Journal Article
utslib.citation.volume	33
utslib.for	0801 Artificial Intelligence and Image Processing
utslib.for	0806 Information Systems
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Computer Science
utslib.copyright.status	closed_access	*
pubs.consider-herdc	false
dc.date.updated	2023-03-17T04:14:12Z
pubs.issue	4
pubs.publication-status	Published
pubs.volume	33
utslib.citation.issue	4

Abstract:

We present a robust method for computing locally bijective global parametrizations aligned with a given cross-field. The singularities of the parametrization in general agree with singularities of the field, except in a small number of cases when several additional cones need to be added in a controlled way. Parametric lines can be constrained to follow an arbitrary set of feature lines on the surface. Our method is based on constructing an initial quad patch partition using robust cross-field integral line tracing. This process is followed by an algorithm modifying the quad layout structure to ensure that consistent parametric lengths can be assigned to the edges. For most meshes, the layout modification algorithm does not add new singularities; a small number of singularities may be added to resolve an explicitly described set of layouts. We demonstrate that our algorithm succeeds on a test data set of over a hundred meshes. Copyright © ACM.

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http://hdl.handle.net/10453/167453