Robust Face Alignment via Inherent Relation Learning and Uncertainty Estimation

Xia, J; Xu, M; Zhang, H; Zhang, J; Huang, W; Cao, H; Wen, S

Robust Face Alignment via Inherent Relation Learning and Uncertainty Estimation

Xia, J Xu, M Zhang, H

Zhang, J Huang, W Cao, H Wen, S

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Publisher:: Institute of Electrical and Electronics Engineers (IEEE)
Publication Type:: Journal Article
Citation:: IEEE Transactions on Pattern Analysis and Machine Intelligence, 2023, pp. 1-18
Issue Date:: 2023

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Full metadata record

Field	Value	Language
dc.contributor.author	Xia, J
dc.contributor.author	Xu, M
dc.contributor.author	Zhang, H https://orcid.org/0000-0002-0021-3634
dc.contributor.author	Zhang, J
dc.contributor.author	Huang, W
dc.contributor.author	Cao, H
dc.contributor.author	Wen, S
dc.date.accessioned	2023-03-26T23:19:02Z
dc.date.available	2023-03-26T23:19:02Z
dc.date.issued	2023
dc.identifier.citation	IEEE Transactions on Pattern Analysis and Machine Intelligence, 2023, pp. 1-18
dc.identifier.issn	0162-8828
dc.identifier.issn	2160-9292
dc.identifier.uri	http://hdl.handle.net/10453/168465
dc.language	en
dc.publisher	Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartof	IEEE Transactions on Pattern Analysis and Machine Intelligence
dc.relation.isbasedon	10.1109/tpami.2023.3260926
dc.rights	info:eu-repo/semantics/embargoedAccess
dc.subject	0801 Artificial Intelligence and Image Processing, 0806 Information Systems, 0906 Electrical and Electronic Engineering
dc.subject.classification	Artificial Intelligence & Image Processing
dc.title	Robust Face Alignment via Inherent Relation Learning and Uncertainty Estimation
dc.type	Journal Article
utslib.for	0801 Artificial Intelligence and Image Processing
utslib.for	0806 Information Systems
utslib.for	0906 Electrical and Electronic Engineering
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
utslib.copyright.status	embargoed	*
utslib.copyright.embargo	2025-03-23T00:00:00+1000Z
dc.date.updated	2023-03-26T23:18:57Z
pubs.publication-status	Published

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http://hdl.handle.net/10453/168465