Automated Diagnosis of Pathological Brain Using Fast Curvelet Entropy Features

Publisher:
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Publication Type:
Journal Article
Citation:
IEEE Transactions on Sustainable Computing, 2020, 5, (3), pp. 416-427
Issue Date:
2020-07-01
Full metadata record
Automated diagnosis of pathological brain not only reduces the diagnostic error significantly but also improves the patient's quality of life, thereby addressing the sustainability issues. The last few decades have witnessed an intensive research on binary classification of brain magnetic resonance (MR) images. Multiclass classification of pathological brain MR images is a more challenging task and the literature on this problem is still in its infancy. In this paper, we propose a new automated diagnosis system to classify the brain MR images into five different categories. Texture features within MR images play a significant role in accurate and efficient pathological brain detection. This work presents the extraction of such vital texture features by calculating the entropy over the curvelet subbands. Two faster and simpler strategies of fast curvelet transform are separately employed for feature extraction and the derived features are termed as FCEntF-I and FCEntF-II. The features are finally subjected to kernel extreme learning machine (K-ELM) for classification. The effectiveness of the proposed scheme is evaluated on multiclass as well as binary brain MR datasets. Comparisons with state-of-the-art methods indicate the superiority of the proposed scheme. The discriminatory potential of FCEntF-I and FCEntF-II features is found better than its counterparts.
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