Investigating electromagnetically induced transparency spectral lineshape distortion due to non-uniform fields in Rydberg-atom electrometry
- Publisher:
- AIP Publishing
- Publication Type:
- Journal Article
- Citation:
- Journal of Applied Physics, 2023, 134, (8)
- Issue Date:
- 2023-08-28
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| Filename | Description | Size | |||
|---|---|---|---|---|---|
| Investigating electromagnetically induced transparency spectral lineshape distortion due to non-uniform fields in Rydberg-atom electrometry.pdf | Published version | 6.1 MB |
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We investigate the effects of spatially non-uniform radio-frequency electric (E) field amplitudes on the spectral line shapes of electromagnetically induced transparency (EIT) signals in Rydberg atomic systems used in electrometry (i.e., the metrology of E-field strengths). Spatially non-uniform fields distort the EIT spectra from that of an ideal case, and understanding this distortion is important in the development of Rydberg atom-based sensors, as these distortions can limit accuracy and sensitivity. To characterize this distortion, we present a model that approximates the atom vapor as multi-layered media and then uses Beer’s law to combine the absorption through its many discrete thin segments. We present a set of expected line distortions caused by various RF electric-field distributions found in practice. This provides an intuitive diagnostic tool for experiments. We compare this model to measured experimental atomic spectra in both two-photon and three-photon excitation schemes in the presence of non-uniform radio-frequency fields. We show that we can accurately model and reproduce the EIT lineshape distortion observed in these experimental data.
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