Temperature Coefficients of Transverse Elastic Properties of Scandium-Doped Aluminum Nitride (ScAlN) Thin Film Grown on Preformed Cavities

Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Type:
Conference Proceeding
Citation:
2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS), 2024, 00, pp. 1-4
Issue Date:
2024-01-26
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