Towards Unparallelled CMOS-compatible Air-coupled pMUT Performance with 30% Sc-doped AlN through an Analysis of Residual Stress Effects

Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Type:
Conference Proceeding
Citation:
2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS), 2024, 00, pp. 1-4
Issue Date:
2024-01-26
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Sc30 pMUT final paper.pdfAccepted version434.46 kB
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