Automatic Test Pattern Generation for Robust Quantum Circuit Testing

Chen, K; Ying, M

Automatic Test Pattern Generation for Robust Quantum Circuit Testing

Chen, K Ying, M

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Publisher:: ASSOC COMPUTING MACHINERY
Publication Type:: Journal Article
Citation:: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 29, (6)
Issue Date:: 2024-11

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Field	Value	Language
dc.contributor.author	Chen, K
dc.contributor.author	Ying, M https://orcid.org/0000-0003-4847-702X
dc.date.accessioned	2025-01-15T04:14:30Z
dc.date.available	2025-01-15T04:14:30Z
dc.date.issued	2024-11
dc.identifier.citation	ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 29, (6)
dc.identifier.issn	1084-4309
dc.identifier.issn	1557-7309
dc.identifier.uri	http://hdl.handle.net/10453/183599
dc.description.abstract	<jats:p>Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This article alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques that can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by (1) theoretical guarantees under reasonable conditions and (2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV), and Bernstein-Vazirani (BV) in IBM Qiskit.</jats:p>
dc.language	English
dc.publisher	ASSOC COMPUTING MACHINERY
dc.relation	National Natural Science Foundation of China61832015
dc.relation.ispartof	ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
dc.relation.isbasedon	10.1145/3689333
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	©ACM2024. This is the author’s version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in 18 September 2024 https://doi.acm.org/10.1145/3689333”
dc.subject	0803 Computer Software, 1006 Computer Hardware
dc.subject.classification	Design Practice & Management
dc.subject.classification	4009 Electronics, sensors and digital hardware
dc.subject.classification	4606 Distributed computing and systems software
dc.subject.classification	4612 Software engineering
dc.title	Automatic Test Pattern Generation for Robust Quantum Circuit Testing
dc.type	Journal Article
utslib.citation.volume	29
utslib.for	0803 Computer Software
utslib.for	1006 Computer Hardware
pubs.organisational-group	University of Technology Sydney
pubs.organisational-group	University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	University of Technology Sydney/Faculty of Engineering and Information Technology/School of Computer Science
pubs.organisational-group	University of Technology Sydney/UTS Groups
pubs.organisational-group	University of Technology Sydney/UTS Groups/Centre for Quantum Software and Information (QSI)
utslib.copyright.status	open_access	*
dc.date.updated	2025-01-15T04:14:29Z
pubs.issue	6
pubs.publication-status	Published
pubs.volume	29
utslib.citation.issue	6

Abstract:

Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This article alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques that can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by (1) theoretical guarantees under reasonable conditions and (2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV), and Bernstein-Vazirani (BV) in IBM Qiskit.

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http://hdl.handle.net/10453/183599