Constrained Empirical Risk Minimization Framework For Distance Metric Learning

IEEE-inst Electrical Electronics Engineers Inc
Publication Type:
Journal Article
IEEE Transactions On Neural Networks And Learning Systems, 2012, 23 (8), pp. 1194 - 1205
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Distance metric learning (DML) has received increasing attention in recent years. In this paper, we propose a constrained empirical risk minimization framework for DML. This framework enriches the state-of-the-art studies on both theoretic and algorithmi
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