An improved model-based method to test circuit faults

Publisher:
Elsevier Science Bv
Publication Type:
Journal Article
Citation:
Theoretical Computer Science, 2005, 341 (1-3), pp. 150 - 161
Issue Date:
2005-01
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This paper presents an improved model-based reasoning method to test circuit faults. The testing procedure is applicable even when the target system contains multiple faulty modes. Using our method, the observation could be planned appropriately to guara
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