An improved model-based method to test circuit faults

Cheng, X; Ouyang, D; Yunfei, J; Zhang, C

An improved model-based method to test circuit faults

Cheng, X Ouyang, D Yunfei, J Zhang, C

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Publication Type:: Journal Article
Citation:: Theoretical Computer Science, 2005, 341 (1-3), pp. 150 - 161
Issue Date:: 2005-09-05

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Field	Value	Language
dc.contributor.author	Cheng, X	en_US
dc.contributor.author	Ouyang, D	en_US
dc.contributor.author	Yunfei, J	en_US
dc.contributor.author	Zhang, C https://orcid.org/0000-0001-5715-7154	en_US
dc.date.issued	2005-09-05	en_US
dc.identifier.citation	Theoretical Computer Science, 2005, 341 (1-3), pp. 150 - 161	en_US
dc.identifier.issn	0304-3975	en_US
dc.identifier.uri	http://hdl.handle.net/10453/3989
dc.description.abstract	This paper presents an improved model-based reasoning method to test circuit faults. The testing procedure is applicable even when the target system contains multiple faulty modes. Using our method, the observation could be planned appropriately to guarantee correct solutions to be in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of our method. The relationship between the testing procedure and the corresponding prime implication is analyzed for algorithmic implementation. © 2005 Elsevier B.V. All rights reserved.	en_US
dc.relation.ispartof	Theoretical Computer Science	en_US
dc.relation.isbasedon	10.1016/j.tcs.2005.04.004	en_US
dc.subject.classification	Computation Theory & Mathematics	en_US
dc.title	An improved model-based method to test circuit faults	en_US
dc.type	Journal Article
utslib.citation.volume	1-3	en_US
utslib.citation.volume	341	en_US
utslib.for	0803 Computer Software	en_US
utslib.for	01 Mathematical Sciences	en_US
utslib.for	08 Information and Computing Sciences	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/DVC (International)
pubs.organisational-group	/University of Technology Sydney/Strength - ACRI - Australia China Relations Institute
pubs.organisational-group	/University of Technology Sydney/Strength - CAI - Centre for Artificial Intelligence
utslib.copyright.status	closed_access
pubs.issue	1-3	en_US
pubs.publication-status	Published	en_US
pubs.volume	341	en_US

Abstract:

This paper presents an improved model-based reasoning method to test circuit faults. The testing procedure is applicable even when the target system contains multiple faulty modes. Using our method, the observation could be planned appropriately to guarantee correct solutions to be in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of our method. The relationship between the testing procedure and the corresponding prime implication is analyzed for algorithmic implementation. © 2005 Elsevier B.V. All rights reserved.

Please use this identifier to cite or link to this item:

http://hdl.handle.net/10453/3989