An improved model-based method to test circuit faults

Elsevier Science Bv
Publication Type:
Journal Article
Theoretical Computer Science, 2005, 341 (1-3), pp. 150 - 161
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This paper presents an improved model-based reasoning method to test circuit faults. The testing procedure is applicable even when the target system contains multiple faulty modes. Using our method, the observation could be planned appropriately to guara
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