Electron irradiationinduced electromigration and diffusion of defects in Mgdoped GaN
- Wileyv C H Verlag Gmbh
- Publication Type:
- Journal article
- Gelhausen Olaf et al. 2003, 'Electron irradiation-induced electro-migration and diffusion of defects in Mg-doped GaN', Wiley-v C H Verlag Gmbh, vol. 239, no. 2, pp. 310-315.
- Issue Date: