Structural and electronic properties of ordered La@C82 films on Si(111)

Elsevier Inc
Publication Type:
Journal Article
Ton-That Cuong et al. 2003, 'Structural and electronic properties of ordered La@C82 films on Si(111)', Elsevier Inc, vol. 522, no. 1-3, pp. L15-L20.
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The growth of endohedral fullerene La@C82 films on Si(1 1 1) has been explored by scanning tunneling microscopy (STM). The STM images reveal the molecules are hexagonally close-packed in multilayer films with the inter-molecular separation similar to that of the La@C82 crystal. Electronic properties of the films have been investigated by ultraviolet photoelectron spectroscopy (UPS) and tunneling spectroscopy, which provide comparable results for the electronic structure of the occupied electronic states. Tunneling spectroscopy also gives an insight into the unoccupied states and shows that the edges of the highest occupied and lowest unoccupied molecular orbitals (HOMO and LUMO) both approach the Fermi level, indicating that the film is metallic or semi-metallic. An electronic structure of the La@C82 film is proposed from the spectroscopic results.
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