Quantification of arsenic in activated carbon using particle induced X-ray emission

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Journal Article
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2006, 251 (1), pp. 191 - 196
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To date, the trace elemental analysis of solids with inhomogeneous internal structure has been limited, particularly in the case of adsorbents. High-energy ion beam based particle induced X-ray emission (PIXE) is an ideal analytical tool suitable for simultaneous quantification of trace elements with high accuracy. In this study, PIXE was used to quantify arsenic in the adsorbents, granular activated carbon (GAC) and powder activated carbon (PAC). Pelletized and unmodified GAC and PAC samples were analyzed along with powder samples deposited on thin teflon filters. These sample preparation methods resulted in samples of various thicknesses and densities. PIXE measurements taken from these samples were compared to results from neutron activation analysis (NAA) and atomic absorption spectroscopy (AAS). There is a good agreement between the values from the NAA and pelletized PIXE measurements and some AAS measurements. © 2006 Elsevier B.V. All rights reserved.
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