Identification and distance measures of measurement apparatus

Publication Type:
Journal Article
Physical Review Letters, 2006, 96 (20)
Issue Date:
Full metadata record
We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided. © 2006 The American Physical Society.
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