Identification and distance measures of measurement apparatus
- Publication Type:
- Journal Article
- Physical Review Letters, 2006, 96 (20)
- Issue Date:
We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided. © 2006 The American Physical Society.
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