Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide

Stevens-Kalceff, M; Prawer, S; Kalceff, W; Orwa, J; Peng, J; McCallum, J; Jamieson, D

Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide

Stevens-Kalceff, M Prawer, S Kalceff, W Orwa, J Peng, J McCallum, J Jamieson, D

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Publisher:: American Institute of Physics
Publication Type:: Journal Article
Citation:: Stevens-Kalceff M et al. 2008, 'Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide', American Institute of Physics, vol. 104, no. 11, pp. 113514-1-113514-9.
Issue Date:: 2008

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Field	Value	Language
dc.contributor.author	Stevens-Kalceff, M	en_US
dc.contributor.author	Prawer, S	en_US
dc.contributor.author	Kalceff, W	en_US
dc.contributor.author	Orwa, J	en_US
dc.contributor.author	Peng, J	en_US
dc.contributor.author	McCallum, J	en_US
dc.contributor.author	Jamieson, D	en_US
dc.date.accessioned	2010-05-28T09:42:44Z
dc.date.available	2010-05-28T09:42:44Z
dc.date.issued	2008	en_US
dc.identifier	2008000776	en_US
dc.identifier.citation	Stevens-Kalceff M et al. 2008, 'Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide', American Institute of Physics, vol. 104, no. 11, pp. 113514-1-113514-9.	en_US
dc.identifier.issn	0021-8979	en_US
dc.identifier.other	C1	en_US
dc.identifier.uri	http://hdl.handle.net/10453/8363
dc.description.abstract	MeV carbon ion implantation followed by thermal annealing in a hydrogen-containing atmosphere produces a layer of diamond nanocrystals within fused quartz (SiO2). Cathodoluminescence (CL) microanalysis in a scanning electron microscope has revealed at least three previously unreported low intensity CL emissions from carbon implanted and thermally annealed fused SiO2. The CL emissions are observed at 2.78 eV [full width at half maximum (FWHM) of 0.08 eV], ~3 eV (FWHM of 0.4 eV), and 3.18 eV (FWHM of 0.11 eV). The peak widths and energies of these emissions are incompatible with any known defects associated with the silicon dioxide host lattice. Nondestructive depth resolved CL microanalysis investigations confirm that these CL emissions originate from the near-surface region, consistent with their association with the layer of diamond nanocrystals	en_US
dc.publisher	American Institute of Physics	en_US
dc.relation.ispartof	Verified OK	en_US
dc.relation.ispartof	Journal of Applied Physics	en_US
dc.relation.isbasedon	http://dx.doi.org/10.1063/1.3039215	en_US
dc.rights	The following article has been submitted to/accepted by Journal of Applied Physics. After it is published, it will be found at http://dx.doi.org/10.1063/1.3039215 .	en_US
dc.subject	annealing, cathodoluminescence, diamond, elemental semiconductors, ion implantation, nanostructured materials, scanning electron microscopy, wide band gap semiconductors	en_US
dc.subject.classification	Condensed Matter Physics	en_US
dc.title	Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide	en_US
dc.type	Journal article
utslib.citation.volume	104	en_US
utslib.citation.number	11	en_US
utslib.location	Melville, USA	en_US
utslib.citation.startpage	113514-1	en_US
utslib.citation.endpage	113514-9	en_US
utslib.identifier.org	SCI.Physics and Advanced Materials	en_US
utslib.for	020400	en_US
utslib.percentage	100	en_US
utslib.copyright.status	closed_access

Abstract:

MeV carbon ion implantation followed by thermal annealing in a hydrogen-containing atmosphere produces a layer of diamond nanocrystals within fused quartz (SiO2). Cathodoluminescence (CL) microanalysis in a scanning electron microscope has revealed at least three previously unreported low intensity CL emissions from carbon implanted and thermally annealed fused SiO2. The CL emissions are observed at 2.78 eV [full width at half maximum (FWHM) of 0.08 eV], ~3 eV (FWHM of 0.4 eV), and 3.18 eV (FWHM of 0.11 eV). The peak widths and energies of these emissions are incompatible with any known defects associated with the silicon dioxide host lattice. Nondestructive depth resolved CL microanalysis investigations confirm that these CL emissions originate from the near-surface region, consistent with their association with the layer of diamond nanocrystals

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http://hdl.handle.net/10453/8363