Browsing byAuthorLynch, PA
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) |
| 2004-01 | Determining the dislocation contrast factor for x-ray line profile analysis | Armstrong, NG; Lynch, PA; Mittemeijer, EJ; Scardi, P |
| 2007-01 | An In Situ Method For The Study Of Strain Broadening Using Synchrotron X-ray Diffraction | Tang, C; Lynch, PA; Cheary, RW; Clark, S |
| 2004-01 | X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributions | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Lynch, PA; Tang, C; Thompson, S; Savvides, N |
