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Browsing byAuthorWijerathna, B
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Showing results 2 to 4 of 4
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Issue Date
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2015-11-20
Iterative coarse to fine approach for interpretation of defect profiles using MFL measurements
Wijerathna, B
;
Kodagoda, S
;
Miro, JV
;
Dissanayake, G
2015-01-01
Iterative Coarse to Fine Approach for Interpretation of Defect Profiles Using MFL Measurements
Wijerathna, B
;
Kodagoda, S
;
Miro, JV
;
Dissanayake, G
2013-06-05
Multiple defect interpretation based on Gaussian processes for MFL technology
Wijerathna, B
;
Vidal-Calleja, T
;
Kodagoda, S
;
Zhang, Q
;
Miro, JV