Browsing byAuthorDiebold, A
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 2005-01 | Characterisation of atomic layer deposition using x-ray reflectometry | Windover, D; Armstrong, NG; Cline, JP; Hung, PY; Diebold, A; Seiler, DG; Diebold, AC; McDonald, R; Ayre, CR; Khosla, RP; Zollner, S; Secula, EM |