Reliability Growth of Open Source Software using Defect Analysis

Publisher:
IEEE Computer Society Publications
Publication Type:
Conference Proceeding
Citation:
Proceedings of International Conference on Computer Science and Software Engineering (CSSE 2008) - Vol 2, 2008, pp. 662 - 667
Issue Date:
2008-01
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We examine two active and popular open source products to observe whether or not open source software has a different defect arrival rate than software developed in-house. The evaluation used two common models of reliability growth models; concave and S shaped and this analysis shows that open source has a different profile of defect arrival. Further investigation indicated that low level design instability is a possible explanation of the different defect growth profile.
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