Characterisation of electron traps in high-k dielectric stacks for Flash memory applications using fast pulse techniques

Zhang, WD; Robinson, C; Zheng, XF; Zhang, JF

Characterisation of electron traps in high-k dielectric stacks for Flash memory applications using fast pulse techniques

Zhang, WD Robinson, C Zheng, XF Zhang, JF

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Publisher:: IEEE, Institute of Electrical and Electronics Engineers
Publication Type:: Conference Proceeding
Citation:: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012, pp. 1030 - 1033 (4)
Issue Date:: 2012-01-01

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Field	Value	Language
dc.contributor.author	Zhang, WD	en_US
dc.contributor.author	Robinson, C	en_US
dc.contributor.author	Zheng, XF	en_US
dc.contributor.author	Zhang, JF	en_US
dc.contributor.editor	Tang, TA	en_US
dc.contributor.editor	Jiang, YL	en_US
dc.date	2012-10-29	en_US
dc.date.issued	2012-01-01	en_US
dc.identifier.citation	2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012, pp. 1030 - 1033 (4)	en_US
dc.identifier.isbn	978-1-4673-2472-4	en_US
dc.identifier.uri	http://hdl.handle.net/10453/120900
dc.publisher	IEEE, Institute of Electrical and Electronics Engineers	en_US
dc.relation.ispartof	2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)	en_US
dc.relation.ispartof	IEEE International Conference on Solid-State and Integrated Circuit Technology	en_US
dc.relation.isbasedon	10.1109/ICSICT.2012.6466698	en_US
dc.rights	© 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.	en_US
dc.rights	info:eu-repo/semantics/closedAccess
dc.title	Characterisation of electron traps in high-k dielectric stacks for Flash memory applications using fast pulse techniques	en_US
dc.type	Conference Proceeding
utslib.location.activity	Xian, PEOPLES R CHINA	en_US
utslib.for	0913 Mechanical Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Mechanical and Mechatronic Engineering
pubs.organisational-group	/University of Technology Sydney/Strength - CAS - Centre for Autonomous Systems
utslib.copyright.status	closed_access	*
pubs.declined	2017-12-06T14:28:21.104+1100
pubs.consider-herdc	false	en_US
pubs.deleted	2017-12-06T14:28:21.104+1100
pubs.finish-date	2012-11-01	en_US
pubs.publication-status	Published	en_US
pubs.start-date	2012-10-29	en_US

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http://hdl.handle.net/10453/120900