Characterisation of electron traps in high-k dielectric stacks for Flash memory applications using fast pulse techniques

Publisher:
IEEE, Institute of Electrical and Electronics Engineers
Publication Type:
Conference Proceeding
Citation:
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012, pp. 1030 - 1033 (4)
Issue Date:
2012-01-01
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