DPIF: A framework for distinguishing unintentional quality problems from potential shilling attacks

Publication Type:
Journal Article
Computers, Materials and Continua, 2019, 59 (1), pp. 331 - 344
Issue Date:
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Copyright © 2019 Tech Science Press. Maliciously manufactured user profiles are often generated in batch for shilling attacks. These profiles may bring in a lot of quality problems but not worthy to be repaired. Since repairing data always be expensive, we need to scrutinize the data and pick out the data that really deserves to be repaired. In this paper, we focus on how to distinguish the unintentional data quality problems from the batch generated fake users for shilling attacks. A two-steps framework named DPIF is proposed for the distinguishment. Based on the framework, the metrics of homology and suspicious degree are proposed. The homology can be used to represent both the similarities of text and the data quality problems contained by different profiles. The suspicious degree can be used to identify potential attacks. The experiments on real-life data verified that the proposed framework and the corresponding metrics are effective.
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