An Empirical Study of Regression Bug Chains in Linux

Xiao, G Zheng, Z Jiang, B Sui, Y

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Field	Value	Language
dc.contributor.author	Xiao, G	en_US
dc.contributor.author	Zheng, Z	en_US
dc.contributor.author	Jiang, B	en_US
dc.contributor.author	Sui, Y https://orcid.org/0000-0002-9510-6574	en_US
dc.date.available	2021-03-31T18:03:31Z
dc.date.issued	2020	en_US
dc.identifier.citation	IEEE Transactions on Reliability, 2020	en_US
dc.identifier.issn	0018-9529	en_US
dc.identifier.uri	http://hdl.handle.net/10453/137411
dc.publisher	Institute of Electrical and Electronics Engineers	en_US
dc.relation	http://purl.org/au-research/grants/arc/DE170101081
dc.relation.ispartof	IEEE Transactions on Reliability	en_US
dc.relation.isbasedon	10.1109/tr.2019.2902171	en_US
dc.rights	info:eu-repo/semantics/openAccess
dc.subject.classification	Operations Research	en_US
dc.title	An Empirical Study of Regression Bug Chains in Linux	en_US
dc.type	Journal Article
utslib.for	0803 Computer Software	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Computer Science
pubs.organisational-group	/University of Technology Sydney/Strength - CAI - Centre for Artificial Intelligence
utslib.copyright.status	open_access	*
pubs.consider-herdc	true	en_US
pubs.publication-status	Published online	en_US

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