A universal method for thermal conductivity measurements on micro-/nano-films with and without substrates using micro-Raman spectroscopy

Wight, NM; Acosta, E; Vijayaraghavan, RK; McNally, PJ; Smirnov, V; Bennett, NS

A universal method for thermal conductivity measurements on micro-/nano-films with and without substrates using micro-Raman spectroscopy

Wight, NM Acosta, E Vijayaraghavan, RK McNally, PJ Smirnov, V Bennett, NS

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Publisher:: Elsevier
Publication Type:: Journal Article
Citation:: Thermal Science and Engineering Progress, 2017, 3, pp. 95-101
Issue Date:: 2017-09-01

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Field	Value	Language
dc.contributor.author	Wight, NM
dc.contributor.author	Acosta, E
dc.contributor.author	Vijayaraghavan, RK
dc.contributor.author	McNally, PJ
dc.contributor.author	Smirnov, V
dc.contributor.author	Bennett, NS
dc.date.accessioned	2022-07-13T04:57:51Z
dc.date.available	2022-07-13T04:57:51Z
dc.date.issued	2017-09-01
dc.identifier.citation	Thermal Science and Engineering Progress, 2017, 3, pp. 95-101
dc.identifier.issn	2451-9049
dc.identifier.issn	2451-9049
dc.identifier.uri	http://hdl.handle.net/10453/158844
dc.description.abstract	The ability to measure intrinsic thermal conductivity via a non-contact, non-destructive process is extremely attractive. Micro-Raman spectroscopy has been demonstrated to enable effective non-contact thermometry with further work providing a non-destructive estimation of values for thermal conductivity on suitable materials. However significant limitations remain for nano- and micro-films. Materials that do not meet dimensional requirements for thickness or that are in-situ on a substrate or supporting structure present significant challenges using existing approaches. For such samples, representative measurements must be obtained using alternative methods that can compromise samples and/or require relative complexity in experimental design and analysis. Here an analytical model is shown allowing thermal conductivity to be measured free of such limitations via a straightforward approach using micro-Raman spectroscopy. Results are then obtained experimentally and values compared with those obtained using a complimentary technique demonstrating an improved accuracy over existing micro-Raman approaches. Furthermore, this model enables the effect of any substrate or supporting structure on measured values to be quantified and estimations for thermal conductivity of the sample itself to then be calculated where an influence is determined. Current estimations determining the threshold of substrate influence are shown to be insufficient and the importance of obtaining values of thermal conductivity for samples themselves under such conditions is demonstrated.
dc.language	English
dc.publisher	Elsevier
dc.relation.ispartof	Thermal Science and Engineering Progress
dc.relation.isbasedon	10.1016/j.tsep.2017.06.009
dc.rights	info:eu-repo/semantics/closedAccess
dc.title	A universal method for thermal conductivity measurements on micro-/nano-films with and without substrates using micro-Raman spectroscopy
dc.type	Journal Article
utslib.citation.volume	3
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Mechanical and Mechatronic Engineering
utslib.copyright.status	closed_access	*
pubs.consider-herdc	false
dc.date.updated	2022-07-13T04:57:50Z
pubs.publication-status	Published
pubs.volume	3

Abstract:

The ability to measure intrinsic thermal conductivity via a non-contact, non-destructive process is extremely attractive. Micro-Raman spectroscopy has been demonstrated to enable effective non-contact thermometry with further work providing a non-destructive estimation of values for thermal conductivity on suitable materials. However significant limitations remain for nano- and micro-films. Materials that do not meet dimensional requirements for thickness or that are in-situ on a substrate or supporting structure present significant challenges using existing approaches. For such samples, representative measurements must be obtained using alternative methods that can compromise samples and/or require relative complexity in experimental design and analysis. Here an analytical model is shown allowing thermal conductivity to be measured free of such limitations via a straightforward approach using micro-Raman spectroscopy. Results are then obtained experimentally and values compared with those obtained using a complimentary technique demonstrating an improved accuracy over existing micro-Raman approaches. Furthermore, this model enables the effect of any substrate or supporting structure on measured values to be quantified and estimations for thermal conductivity of the sample itself to then be calculated where an influence is determined. Current estimations determining the threshold of substrate influence are shown to be insufficient and the importance of obtaining values of thermal conductivity for samples themselves under such conditions is demonstrated.

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http://hdl.handle.net/10453/158844