Dynamic X-ray testing in electronics production - Application of data mining techniques for quality prediction
- Publisher:
- Walter de Gruyter GmbH
- Publication Type:
- Journal Article
- Citation:
- ZWF Zeitschrift fuer Wirtschaftlichen Fabrikbetrieb, 2019, 114, (5), pp. 264-267
- Issue Date:
- 2019-05-01
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19578737_8962760690005671.pdf | Published version | 207.86 kB |
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This paper presents a concept for dynamic X-ray testing in electronics manufacturing that allows the prediction of final product quality in the running process by evaluating process data using data mining techniques. This enables the reduction of X-ray testing volumes through the development of dynamic inspection plans.
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