Dynamic X-ray testing in electronics production - Application of data mining techniques for quality prediction

Publisher:
Walter de Gruyter GmbH
Publication Type:
Journal Article
Citation:
ZWF Zeitschrift fuer Wirtschaftlichen Fabrikbetrieb, 2019, 114, (5), pp. 264-267
Issue Date:
2019-05-01
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This paper presents a concept for dynamic X-ray testing in electronics manufacturing that allows the prediction of final product quality in the running process by evaluating process data using data mining techniques. This enables the reduction of X-ray testing volumes through the development of dynamic inspection plans.
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