A quantitative metric for research impact using patent citation analytics

Publisher:
Elsevier
Publication Type:
Journal Article
Citation:
World Patent Information, 2022, 71, pp. 102126
Issue Date:
2022-12-01
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1-s2.0-S0172219022000333-main.pdf1.24 MB
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A new metric for Research Impact index is presented using only X-type and Y-type patent examiner citations cited during prosecution of patents where the patent family must have at least one US patent family member, where the citations are de-duplicated (to remove double counting associated with duplicate Patent Examiner citations from different jurisdictions when examining the same invention), and where the citations are for both non-patent publications and patent publications, where academics are, respectively, the authors and inventors. The quantitative outcomes are demonstrated using a 10-year dataset of 22,255 publications from the Faculty of Engineering and IT at the University of Technology Sydney.
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