A quantitative metric for research impact using patent citation analytics
- Publisher:
- Elsevier
- Publication Type:
- Journal Article
- Citation:
- World Patent Information, 2022, 71, pp. 102126
- Issue Date:
- 2022-12-01
Closed Access
Filename | Description | Size | |||
---|---|---|---|---|---|
1-s2.0-S0172219022000333-main.pdf | 1.24 MB |
Copyright Clearance Process
- Recently Added
- In Progress
- Closed Access
This item is closed access and not available.
A new metric for Research Impact index is presented using only X-type and Y-type patent examiner citations cited during prosecution of patents where the patent family must have at least one US patent family member, where the citations are de-duplicated (to remove double counting associated with duplicate Patent Examiner citations from different jurisdictions when examining the same invention), and where the citations are for both non-patent publications and patent publications, where academics are, respectively, the authors and inventors. The quantitative outcomes are demonstrated using a 10-year dataset of 22,255 publications from the Faculty of Engineering and IT at the University of Technology Sydney.
Please use this identifier to cite or link to this item: