Remote-Sensing Data and Deep-Learning Techniques in Crop Mapping and Yield Prediction: A Systematic Review

Publisher:
MDPI
Publication Type:
Journal Article
Citation:
Remote Sensing, 2023, 15, (8)
Issue Date:
2023-04-01
Full metadata record
Reliable and timely crop-yield prediction and crop mapping are crucial for food security and decision making in the food industry and in agro-environmental management. The global coverage, rich spectral and spatial information and repetitive nature of remote sensing (RS) data have made them effective tools for mapping crop extent and predicting yield before harvesting. Advanced machine-learning methods, particularly deep learning (DL), can accurately represent the complex features essential for crop mapping and yield predictions by accounting for the nonlinear relationships between variables. The DL algorithm has attained remarkable success in different fields of RS and its use in crop monitoring is also increasing. Although a few reviews cover the use of DL techniques in broader RS and agricultural applications, only a small number of references are made to RS-based crop-mapping and yield-prediction studies. A few recently conducted reviews attempted to provide overviews of the applications of DL in crop-yield prediction. However, they did not cover crop mapping and did not consider some of the critical attributes that reveal the essential issues in the field. This study is one of the first in the literature to provide a thorough systematic review of the important scientific works related to state-of-the-art DL techniques and RS in crop mapping and yield estimation. This review systematically identified 90 papers from databases of peer-reviewed scientific publications and comprehensively reviewed the aspects related to the employed platforms, sensors, input features, architectures, frameworks, training data, spatial distributions of study sites, output scales, evaluation metrics and performances. The review suggests that multiple DL-based solutions using different RS data and DL architectures have been developed in recent years, thereby providing reliable solutions for crop mapping and yield prediction. However, challenges related to scarce training data, the development of effective, efficient and generalisable models and the transparency of predictions should be addressed to implement these solutions at scale for diverse locations and crops.
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