Skip navigation
Statistics
Help
About OPUS
How to Deposit
Managing Copyright
Browse
UTS Organisational Groups
Browse Items by:
Issue Date
Author
Title
Type
ARC/NHRMC Funded
Search OPUS
OPUS at UTS
Browsing byAuthorPhillips, MR
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
or enter first few letters:
Sort by:
title
issue date
submit date
ARC/NHRMC funded
In order:
Ascending
Descending
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Authors/Record:
All
1
5
10
15
20
25
30
35
40
45
50
Showing results 165 to 173 of 173
< previous
Issue Date
Title
Author(s)
1997-01-01
Type I and type II alignment of the light hole band in In<inf>0.15</inf>Ga<inf>0.85</inf>As/GaAs and in In<inf>0.15</inf>Ga<inf>0.85</inf>As/Al<inf>0.15</inf>Ga<inf>0.85</inf>As strained quantum wells
Goldys, EM
;
Zuo, HY
;
Phillips, MR
;
Contessa, CM
;
Vaughan, MR
;
Tansley, TL
2019-12-01
Vacancy cluster in ZnO films grown by pulsed laser deposition
Wang, Z
;
Luo, C
;
Anwand, W
;
Wagner, A
;
Butterling, M
;
Rahman, MA
;
Phillips, MR
;
Ton-That, C
;
Younas, M
;
Su, S
;
Ling, FCC
2012-12-01
Very early poststroke aphasia therapy: A pilot randomized controlled efficacy trial
Godecke, E
;
Hird, K
;
Lalor, EE
;
Rai, T
;
Phillips, MR
2016-07-15
Wafer-scale epitaxial lift-off of optoelectronic grade GaN from a GaN substrate using a sacrificial ZnO interlayer
Rajan, A
;
Rogers, DJ
;
Ton-That, C
;
Zhu, L
;
Phillips, MR
;
Sundaram, S
;
Gautier, S
;
Moudakir, T
;
El-Gmili, Y
;
Ougazzaden, A
;
Sandana, VE
;
Teherani, FH
;
Bove, P
;
Prior, KA
;
Djebbour, Z
;
McClintock, R
;
Razeghi, M
2006-08-01
X-ray mapping and post processing
Wuhrer, R
;
Moran, K
;
Phillips, MR
2010-10-01
X-ray mapping and scatter diagram analysis of the discoloring products resulting from the interaction of artist's pigments
White, R
;
Thomas, P
;
Phillips, MR
;
Moran, K
;
Wuhrer, R
2006-08-01
X-ray mapping using a multiple-EDS (DUAL) detectors
Wuhrer, R
;
Moran, K
;
Phillips, MR
;
Davey, P
2002-11-20
X-ray microanalysis of insulators in a variable pressure environment
Toth, M
;
Craven, JP
;
Phillips, MR
;
Thiel, BL
;
Donald, AM
2002-03-15
X-ray spectrometry investigation of electrical isolation in GaN
Kucheyev, SO
;
Toth, M
;
Phillips, MR
;
Williams, JS
;
Jagadish, C
;
Li, G