Browsing byAuthorScardi, P
Showing results 1 to 3 of 3
Issue Date | Title | Author(s) |
2004-01 | A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Mittemeijer, EJ; Scardi, P |
2006-01 | Considerations concerning Wilkens theory of dislocation line-broadening | Armstrong, NG; Leoni, M; Scardi, P |
2004-01 | Determining the dislocation contrast factor for x-ray line profile analysis | Armstrong, NG; Lynch, PA; Mittemeijer, EJ; Scardi, P |