Mid-Infrared 2.86-μm Emission Characteristics in Highly Dy<sup>3+</sup> Doped Fluoroaluminate Glass

Zhou, B; Huang, F; Cai, M; Tian, Y; Zhou, J; Xu, S; Zhang, J

Mid-Infrared 2.86-μm Emission Characteristics in Highly Dy<sup>3+</sup> Doped Fluoroaluminate Glass

Zhou, B Huang, F Cai, M Tian, Y Zhou, J

Xu, S Zhang, J

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Publication Type:: Journal Article
Citation:: IEEE Photonics Technology Letters, 2016, 28 (4), pp. 429 - 432
Issue Date:: 2016-02-15

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Field	Value	Language
dc.contributor.author	Zhou, B	en_US
dc.contributor.author	Huang, F	en_US
dc.contributor.author	Cai, M	en_US
dc.contributor.author	Tian, Y	en_US
dc.contributor.author	Zhou, J https://orcid.org/0000-0002-0605-5745	en_US
dc.contributor.author	Xu, S	en_US
dc.contributor.author	Zhang, J	en_US
dc.date.issued	2016-02-15	en_US
dc.identifier.citation	IEEE Photonics Technology Letters, 2016, 28 (4), pp. 429 - 432	en_US
dc.identifier.issn	1041-1135	en_US
dc.identifier.uri	http://hdl.handle.net/10453/116428
dc.description.abstract	© 1989-2012 IEEE. A highly Dy3+ doped (10 mol%) fluoroaluminate glass was successfully fabricated by melt-quenching method for the first time. The intensity of 2.86- μm emission increases with the Dy3+ ions concentration without fluorescence quenching because of the large dispersibility of Dy3+ ions in this glass network without clustering. Radiative and emission parameters were calculated based on the Judd-Ofelt theory, which show that the 10 mol% highly doped sample possesses a high calculated spontaneous transition probability (32.01 S-1) together with a large emission cross section (5.94 × 10-21 cm2) of Dy3+: 6H13/2 to 6H15/2 transition. In addition, the increasing Ωt (t=2,4,6) values, which caused by a complex outermost electron configuration of Dy3+ ions, have been further discussed to analyze the partial glass structure.	en_US
dc.relation.ispartof	IEEE Photonics Technology Letters	en_US
dc.relation.isbasedon	10.1109/LPT.2015.2498175	en_US
dc.subject.classification	Optoelectronics & Photonics	en_US
dc.title	Mid-Infrared 2.86-μm Emission Characteristics in Highly Dy<sup>3+</sup> Doped Fluoroaluminate Glass	en_US
dc.type	Journal Article
utslib.citation.volume	4	en_US
utslib.citation.volume	28	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0912 Materials Engineering	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
pubs.organisational-group	/University of Technology Sydney/Strength - IBMD - Initiative for Biomedical Devices
utslib.copyright.status	closed_access
pubs.issue	4	en_US
pubs.publication-status	Published	en_US
pubs.volume	28	en_US

Abstract:

© 1989-2012 IEEE. A highly Dy3+ doped (10 mol%) fluoroaluminate glass was successfully fabricated by melt-quenching method for the first time. The intensity of 2.86- μm emission increases with the Dy3+ ions concentration without fluorescence quenching because of the large dispersibility of Dy3+ ions in this glass network without clustering. Radiative and emission parameters were calculated based on the Judd-Ofelt theory, which show that the 10 mol% highly doped sample possesses a high calculated spontaneous transition probability (32.01 S-1) together with a large emission cross section (5.94 × 10-21 cm2) of Dy3+: 6H13/2 to 6H15/2 transition. In addition, the increasing Ωt (t=2,4,6) values, which caused by a complex outermost electron configuration of Dy3+ ions, have been further discussed to analyze the partial glass structure.

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http://hdl.handle.net/10453/116428