Mid-Infrared 2.86-μm Emission Characteristics in Highly Dy3+ Doped Fluoroaluminate Glass

Publisher:
Institute of Electrical and Electronics Engineers
Publication Type:
Journal Article
Citation:
IEEE Photonics Technology Letters, 2016, 28 (4), pp. 429 - 432
Issue Date:
2016-02-15
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A highly Dy3+ doped (10 mol%) fluoroaluminate glass was successfully fabricated by melt-quenching method for the first time. The intensity of 2.86-μm emission increases with the Dy3+ ions concentration without fluorescence quenching because of the large dispersibility of Dy3+ ions in this glass network without clustering. Radiative and emission parameters were calculated based on the Judd-Ofelt theory, which show that the 10 mol% highly doped sample possesses a high calculated spontaneous transition probability (32.01 S-1) together with a large emission cross section (5.94 × 10-21 cm2) of Dy3+: 6H13/2 →6H15/2 transition. In addition, the increasing Qt (t = 2,4,6) values, which caused by a complex outermost electron configuration of Dy3+ ions, have been further discussed to analyze the partial glass structure.
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