Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Wang, F; Toe, WJ; Hartstone, A; Lee, WM; McGloin, D; Gao, Q; Tan, HH; Jagadish, C; Reece, PJ

Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Wang, F

Toe, WJ Hartstone, A Lee, WM McGloin, D

Gao, Q Tan, HH Jagadish, C Reece, PJ

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Publication Type:: Conference Proceeding
Citation:: Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8458
Issue Date:: 2012-12-01

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Field	Value	Language
dc.contributor.author	Wang, F https://orcid.org/0000-0001-7403-3305	en_US
dc.contributor.author	Toe, WJ	en_US
dc.contributor.author	Hartstone, A	en_US
dc.contributor.author	Lee, WM	en_US
dc.contributor.author	McGloin, D https://orcid.org/0000-0002-0075-4481	en_US
dc.contributor.author	Gao, Q	en_US
dc.contributor.author	Tan, HH	en_US
dc.contributor.author	Jagadish, C	en_US
dc.contributor.author	Reece, PJ	en_US
dc.date.issued	2012-12-01	en_US
dc.identifier.citation	Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8458	en_US
dc.identifier.isbn	9780819491756	en_US
dc.identifier.issn	0277-786X	en_US
dc.identifier.uri	http://hdl.handle.net/10453/121226
dc.description.abstract	We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction. © 2012 SPIE.	en_US
dc.relation.ispartof	Proceedings of SPIE - The International Society for Optical Engineering	en_US
dc.relation.isbasedon	10.1117/12.928558	en_US
dc.title	Mapping optical process in semiconductor nanowires using dynamic optical tweezers	en_US
dc.type	Conference Proceeding
utslib.citation.volume	8458	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	1007 Nanotechnology	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
pubs.organisational-group	/University of Technology Sydney/Strength - IBMD - Initiative for Biomedical Devices
utslib.copyright.status	closed_access
pubs.publication-status	Published	en_US
pubs.volume	8458	en_US

Abstract:

We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction. © 2012 SPIE.

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http://hdl.handle.net/10453/121226