Mirror enhanced STED super-resolution microscopy

Publication Type:
Conference Proceeding
Citation:
2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings, 2017, 2017-January pp. 1 - 2
Issue Date:
2017-10-25
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© 2017 IEEE. Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.
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