A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam
- Publisher:
- TAYLOR & FRANCIS LTD
- Publication Type:
- Journal Article
- Citation:
- Radiation Effects and Defects in Solids, 2020, 175, (3-4), pp. 342-355
- Issue Date:
- 2020-03-03
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© 2020, © 2020 The Author(s). Published by Informa UK Limited, trading as Taylor & Francis Group. A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and (Formula presented.) amorphous thin films is presented; possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.
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