Binary Spectrum Feature for Improved Classifier Performance

Publisher:
IEEE
Publication Type:
Conference Proceeding
Citation:
16th IEEE International Conference on Control, Automation, Robotics and Vision, ICARCV 2020, 2021, 00, pp. 1117-1122
Issue Date:
2021
Full metadata record
Classification has become a vital task in modern machine learning and Artificial Intelligence applications, including smart sensing. Numerous machine learning techniques are available to perform classification. Similarly, numerous practices, such as feature selection (i.e., selection of a subset of descriptor variables that optimally describe the output), are available to improve classifier performance. In this paper, we consider the case of a given supervised learning classification task that has to be performed making use of continuous-valued features. It is assumed that an optimal subset of features has already been selected. Therefore, no further feature reduction, or feature addition, is to be carried out. Then, we attempt to improve the classification performance by passing the given feature set through a transformation that produces a new feature set which we have named the 'Binary Spectrum'. Via a case study example done on some Pulsed Eddy Current sensor data captured from an infrastructure monitoring task, we demonstrate how the classification accuracy of a Support Vector Machine (SVM) classifier increases through the use of this Binary Spectrum feature, indicating the feature transformation's potential for broader usage.
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