Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere

Publisher:
International Society for Optical Engineering
Publication Type:
Conference Proceeding
Citation:
Proceedings of the SPIE. Optical Diagnostic Methods for Inorganic Meterials III, 2003, pp. 91 - 100
Issue Date:
2003-01
Full metadata record
Files in This Item:
Filename Description Size
Thumbnail2003000989.pdf520.4 kB
Adobe PDF
When a beam of light is incident on a translucent sample, a significant fraction of the light is scattered at high angles. Some of this scattered light may be trapped inside the substrate through multiple reflections and total internal reflection, similar to light coupling into an optical fiber. The trapping depends on factors such as the surface roughness of the external surfaces and/or the size and distribution of scattering particles inside the sample. The scattered light may thus escape out of the sample at a shifted position relative to the incident beam. This leads to port losses in an integrating sphere. The detected signal from the light entering the sphere then underestimates the hemispherical transmittance. In this paper the signal versus lateral position has been measured in an attempt to estimate the error and to find an extrapolation procedure for the correct transmittance value. The lateral measurements were carried out by moving a detector behind the sample, a procedure carried out at several angles of incidence. Different illumination methods have also been studied both theoretically and experimentally to further investigate what effect light trapping can have when characterising scattering samples.
Please use this identifier to cite or link to this item: