Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques

Publication Type:
Conference Proceeding
30th Annual Condensed matter and materials meeting, 2006, pp. 1 - 4
Issue Date:
Full metadata record
Files in This Item:
Filename Description SizeFormat
2006005346.pdf259.98 kBAdobe PDF
The techniques used to identify nanoparticle size and shape characteristics are o vital importance in the developemnt of functional nanoparticles. Each technique offers different advantages: this work compares the two techniques of transmission electron microscopy (TEM) and x-ray diffraction (XRD) analysis by charactering CeO2 nanoparticle specimens. Whole Powder Pattern Modelling (WPPM) is used to quantify the specimens dislocations and size characteristics from XRD data. Using admixed samples we test and extend the techniques. We show that XRD accurately characterises small crystallite distributions and that larger crystallite distributions necessitate further investigation.
Please use this identifier to cite or link to this item: