Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques

Vella, A; Whitley, RJ; Armstrong, NG; Dowd, AR; Cline, JP

Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques

Vella, A Whitley, RJ Armstrong, NG Dowd, AR

Cline, JP

Permalink

Publisher:: AIP
Publication Type:: Conference Proceeding
Citation:: 30th Annual Condensed matter and materials meeting, 2006, pp. 1 - 4
Issue Date:: 2006-01

Open Access

Copyright Clearance Process

Recently Added
In Progress
Open Access

This item is open access.

Adobe PDF

Download full textAdobe PDF (259.98 kB)

View statistics

Full metadata record

Field	Value	Language
dc.contributor.author	Vella, A	en_US
dc.contributor.author	Whitley, RJ	en_US
dc.contributor.author	Armstrong, NG	en_US
dc.contributor.author	Dowd, AR https://orcid.org/0000-0002-0500-3599	en_US
dc.contributor.author	Cline, JP	en_US
dc.contributor.editor	Avdeev, M	en_US
dc.date	2006-02-07	en_US
dc.date.issued	2006-01	en_US
dc.identifier.citation	30th Annual Condensed matter and materials meeting, 2006, pp. 1 - 4	en_US
dc.identifier.isbn	1-920791-09-4	en_US
dc.identifier.uri	http://hdl.handle.net/10453/1703
dc.description.abstract	The techniques used to identify nanoparticle size and shape characteristics are o vital importance in the developemnt of functional nanoparticles. Each technique offers different advantages: this work compares the two techniques of transmission electron microscopy (TEM) and x-ray diffraction (XRD) analysis by charactering CeO2 nanoparticle specimens. Whole Powder Pattern Modelling (WPPM) is used to quantify the specimens dislocations and size characteristics from XRD data. Using admixed samples we test and extend the techniques. We show that XRD accurately characterises small crystallite distributions and that larger crystallite distributions necessitate further investigation.	en_US
dc.publisher	AIP	en_US
dc.relation.ispartof	30th Annual Condensed matter and materials meeting	en_US
dc.relation.ispartof	Annual Condensed matter and materials meeting	en_US
dc.title	Analysis of admixed CeO2 nanoparticles via TEM and x-ray diffraction techniques	en_US
dc.type	Conference Proceeding
utslib.location	Australia	en_US
utslib.location.activity	Wagga Wagga	en_US
utslib.for	0204 Condensed Matter Physics	en_US
utslib.for	0205 Optical Physics	en_US
dc.location.activity	Wagga Wagga	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	open_access
pubs.consider-herdc	true	en_US
pubs.place-of-publication	Australia	en_US
pubs.start-date	2006-02-07	en_US

Abstract:

The techniques used to identify nanoparticle size and shape characteristics are o vital importance in the developemnt of functional nanoparticles. Each technique offers different advantages: this work compares the two techniques of transmission electron microscopy (TEM) and x-ray diffraction (XRD) analysis by charactering CeO2 nanoparticle specimens. Whole Powder Pattern Modelling (WPPM) is used to quantify the specimens dislocations and size characteristics from XRD data. Using admixed samples we test and extend the techniques. We show that XRD accurately characterises small crystallite distributions and that larger crystallite distributions necessitate further investigation.

Please use this identifier to cite or link to this item:

http://hdl.handle.net/10453/1703