Characterisation of the optical properties of InGaN MQW structures using a combined SEM and CL spectral mapping system

Lockrey, MN; Phillips, MR

Characterisation of the optical properties of InGaN MQW structures using a combined SEM and CL spectral mapping system

Lockrey, MN

Phillips, MR

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Publication Type:: Journal Article
Citation:: Journal of Semiconductors, 2011, 32 (1)
Issue Date:: 2011-01-01

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Field	Value	Language
dc.contributor.author	Lockrey, MN https://orcid.org/0000-0002-0050-2858	en_US
dc.contributor.author	Phillips, MR https://orcid.org/0000-0003-1522-9281	en_US
dc.date.issued	2011-01-01	en_US
dc.identifier.citation	Journal of Semiconductors, 2011, 32 (1)	en_US
dc.identifier.issn	1674-4926	en_US
dc.identifier.uri	http://hdl.handle.net/10453/32114
dc.description.abstract	We demonstrate the ability of a combined scanning electron microscope and cathodoluminescence (CL) spectral mapping system to provide important spatially resolved information. The degree of inhomogeneity in spectral output across a multi-quantum well sample is measured using the SEM-CL system as well as measuring the efficiency roll-off with increasing carrier concentration. The effects of low energy electron beam modification on the InGaN/GaN multi quantum wells have also been characterized.	en_US
dc.relation.ispartof	Journal of Semiconductors	en_US
dc.relation.isbasedon	10.1088/1674-4926/32/1/012001	en_US
dc.subject.classification	Applied Physics	en_US
dc.title	Characterisation of the optical properties of InGaN MQW structures using a combined SEM and CL spectral mapping system	en_US
dc.type	Journal Article
utslib.citation.volume	1	en_US
utslib.citation.volume	32	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
pubs.organisational-group	/University of Technology Sydney/Strength - CCET - Centre for Clean Energy Technology
utslib.copyright.status	closed_access
pubs.issue	1	en_US
pubs.publication-status	Published	en_US
pubs.volume	32	en_US

Abstract:

We demonstrate the ability of a combined scanning electron microscope and cathodoluminescence (CL) spectral mapping system to provide important spatially resolved information. The degree of inhomogeneity in spectral output across a multi-quantum well sample is measured using the SEM-CL system as well as measuring the efficiency roll-off with increasing carrier concentration. The effects of low energy electron beam modification on the InGaN/GaN multi quantum wells have also been characterized.

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http://hdl.handle.net/10453/32114