Electron Beam Current Loss at the High Vacuum High Pressure Boundary in the Environmental Scanning Electron Microscope

Cambridge University Press.
Publication Type:
Journal Article
Microscopy & Microanalysis, 2001, 7 (5), pp. 397 - 406
Issue Date:
Full metadata record
Files in This Item:
Filename Description Size
Thumbnail2004004439.pdf757.97 kB
Adobe PDF
Please use this identifier to cite or link to this item: