Imaging point defects using a transmission electron microscope with controllable spherical aberration
- Publication Type:
- Journal Article
- Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties, 2001, 81 (11), pp. 1687 - 1699
- Issue Date:
Copyright Clearance Process
- Recently Added
- In Progress
- Closed Access
This item is closed access and not available.
Computer simulations are utilized to show how to use a transmission electron microscope which has an objective lens with an adjustable coefficient of spherical aberration to determine the three spatial coordinates of a single heavy atom embedded in a crystal. This information can be obtained by forming an image with only those electrons that have been scattered through a large angle by the crystal. By using a high-angle annular dark-field aperture the atoms can be considered as independent scatterers, in contrast with imaging with low-angle coherent scattering. In addition, by reducing the aberration coefficients of the lens, the effective outer radius of the aperture can be made large, thereby leading to a small depth of focus. Calculations show that this form of imaging produces detectable contrast with currently available aberration correctors. sources and detectors. © 2001 Taylor & Francis Group, LLC.
Please use this identifier to cite or link to this item: