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Showing results 441 to 453 of 453< previous 
Issue DateTitleAuthor(s)
2019Variance reduction properties of the reparameterization trickXu, M; Quiroz, M; Kohn, R; Sisson, SA
2018-11-01Variational approximations for frequentist and Bayesian inferenceMaestrini, L; Wand, M; Abbruzzo, A; Brentari, E; Chiodi, M; Piacentino, D
2017-11-21Versatile upconversion surfaces evaluation platform for bio-nano surface selection for nervous systemFu, LB; Shi, BY; Jin, DY; Chung, R
2005-01Very low Fresnel losses in rod-type photonic crystalsWhite, TP; de Sterke, CM; Botten, LC; McPhedran, RC; NA
2003-01Vibrations of a circular cylinder in oblique incidence revisitedServant, J; Guenneau, S; Movchan, AB; Poulton, CG; Movchan, AB
-What is mastered in Mastery Learning?Groen, L; Coupland, M; Manuel, K
2000-01Worst-case performance of critical path type algorithmsSingh, G; Zinder, Y; Kozan, E
2004-01X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributionsArmstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Lynch, PA; Tang, C; Thompson, S; Savvides, N
2006-08-01X-ray mapping and post processingWuhrer, R; Moran, K; Phillips, MR
2006-08-01X-ray mapping using a multiple-EDS (DUAL) detectorsWuhrer, R; Moran, K; Phillips, MR; Davey, P
2005-01X-ray Mapping using Multiple EDS and WDS DetectorsWuhrer, R; Moran, K; Phillips, M; Davey, P; al, RPE
2002-11-20X-ray microanalysis of insulators in a variable pressure environmentToth, M; Craven, JP; Phillips, MR; Thiel, BL; Donald, AM
2001-01X-Ray Micronalaysis in the Environmentl SEM Using Mapping and Fourier Deconvolution TechniquesPhillips, M; Griffin, B; Drouin, D; Nockolds, C; Remond, G; Lyman, C
Showing results 441 to 453 of 453< previous