X-ray Mapping using Multiple EDS and WDS Detectors

Wuhrer, R; Moran, K; Phillips, M; Davey, P

X-ray Mapping using Multiple EDS and WDS Detectors

Wuhrer, R Moran, K Phillips, M

Davey, P

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Publisher:: Cambridge University Press
Publication Type:: Conference Proceeding
Citation:: Proceeding Microscopy and Microanalysis Vol 11 (Suppl2), 2005, 11 pp. 1678 - 1679
Issue Date:: 2005-01

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Field	Value	Language
dc.contributor.author	Wuhrer, R	en_US
dc.contributor.author	Moran, K	en_US
dc.contributor.author	Phillips, M https://orcid.org/0000-0003-1522-9281	en_US
dc.contributor.author	Davey, P	en_US
dc.contributor.editor	al, RPE	en_US
dc.date	2005-07-31	en_US
dc.date.issued	2005-01	en_US
dc.identifier.citation	Proceeding Microscopy and Microanalysis Vol 11 (Suppl2), 2005, 11 pp. 1678 - 1679	en_US
dc.identifier.issn	1431-9276	en_US
dc.identifier.uri	http://hdl.handle.net/10453/789
dc.description.abstract	High quality x-ray mapping (XRM) has been used for over 30 years by experienced wavelength dispersive spectroscopy (WDS) operators. Manufacturers have been developing similar techniques using energy dispersive spectroscopy (EDS) over the last 20 years. This has been generally unsuccssful due to a number of problems such as poor computer specifications, cost, time to map and generally poor peak to bacjground ratios (P:B). With improvements in all the above parameters EDS mapping is now gaining in popularity.	en_US
dc.publisher	Cambridge University Press	en_US
dc.relation.ispartof	Proceeding Microscopy and Microanalysis Vol 11 (Suppl2)	en_US
dc.relation.ispartof	Microscopy and Microanalysis	en_US
dc.relation.isbasedon	10.1017/S1431927605504859	en_US
dc.subject.classification	Microscopy	en_US
dc.title	X-ray Mapping using Multiple EDS and WDS Detectors	en_US
dc.type	Conference Proceeding
utslib.citation.volume	11	en_US
utslib.location	United Kingdom	en_US
utslib.location.activity	Honolulu, USA	en_US
utslib.for	1007 Nanotechnology	en_US
utslib.for	0204 Condensed Matter Physics	en_US
utslib.for	0601 Biochemistry and Cell Biology	en_US
utslib.for	0912 Materials Engineering	en_US
dc.location.activity	Honolulu, USA	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
pubs.organisational-group	/University of Technology Sydney/Strength - CCET - Centre for Clean Energy Technology
utslib.copyright.status	open_access
pubs.consider-herdc	false	en_US
pubs.place-of-publication	United Kingdom	en_US
pubs.start-date	2005-07-31	en_US
pubs.volume	11	en_US

Abstract:

High quality x-ray mapping (XRM) has been used for over 30 years by experienced wavelength dispersive spectroscopy (WDS) operators. Manufacturers have been developing similar techniques using energy dispersive spectroscopy (EDS) over the last 20 years. This has been generally unsuccssful due to a number of problems such as poor computer specifications, cost, time to map and generally poor peak to bacjground ratios (P:B). With improvements in all the above parameters EDS mapping is now gaining in popularity.

Please use this identifier to cite or link to this item:

http://hdl.handle.net/10453/789