X-ray Mapping using Multiple EDS and WDS Detectors

Cambridge University Press
Publication Type:
Conference Proceeding
Proceeding Microscopy and Microanalysis Vol 11 (Suppl2), 2005, 11 pp. 1678 - 1679
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High quality x-ray mapping (XRM) has been used for over 30 years by experienced wavelength dispersive spectroscopy (WDS) operators. Manufacturers have been developing similar techniques using energy dispersive spectroscopy (EDS) over the last 20 years. This has been generally unsuccssful due to a number of problems such as poor computer specifications, cost, time to map and generally poor peak to bacjground ratios (P:B). With improvements in all the above parameters EDS mapping is now gaining in popularity.
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