Effect of injection current on the repeatability of laser diode junction voltage-temperature measurements

Publication Type:
Journal Article
Citation:
Journal of Applied Physics, 2007, 101 (2)
Issue Date:
2007-03-13
Metrics:
Full metadata record
Files in This Item:
Filename Description Size
Thumbnail2006012830.pdf399.51 kB
Adobe PDF
The junction-voltage temperature relationship of a laser diode is used to determine the temperature of the device in the range -20 to 120 °C. We consider changes that occur to this relationship when the diode is driven at its nominal operating current and above. It is found that estimates of the parameters that appear in a function fitted to the voltage-temperature data are sensitive to driving currents at and above the nominal operating current. Changes in parameter estimates are attributed to degradation due to surface recombination at facets occurring when the laser diode is overdriven. An indication of this degradation is the change in the ideality factor that occurs as the current to the device is raised. This work indicates that the temperature of the junction can be determined over the range -20 to 120 °C with a standard uncertainty of ≈0.5 °C. © 2007 American Institute of Physics.
Please use this identifier to cite or link to this item: