Effective impedance modeling of metamaterial structures

Dossou, KB; Poulton, CG; Botten, LC

Effective impedance modeling of metamaterial structures

Dossou, KB

Poulton, CG

Botten, LC

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Publication Type:: Journal Article
Citation:: Journal of the Optical Society of America A: Optics and Image Science, and Vision, 2016, 33 (3), pp. 361 - 372
Issue Date:: 2016-03-01

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Field	Value	Language
dc.contributor.author	Dossou, KB https://orcid.org/0000-0002-2342-8945	en_US
dc.contributor.author	Poulton, CG https://orcid.org/0000-0002-2707-3424	en_US
dc.contributor.author	Botten, LC https://orcid.org/0000-0001-6471-6954	en_US
dc.date.available	2016-01-06	en_US
dc.date.issued	2016-03-01	en_US
dc.identifier.citation	Journal of the Optical Society of America A: Optics and Image Science, and Vision, 2016, 33 (3), pp. 361 - 372	en_US
dc.identifier.issn	1084-7529	en_US
dc.identifier.uri	http://hdl.handle.net/10453/47676
dc.description.abstract	© 2016 Optical Society of America. We present methods for retrieving the effective impedance of metamaterials from the Fresnel reflection coefficients at the interface between two semi-infinite media. The derivation involves the projection of rigorous modal expansions onto the dominant modes of the two semi-infinite media. It is shown that the effective impedance can also be written as a ratio of averaged field quantities. Thus, a number of effective impedance formulas, previously obtained by field averaging techniques, can also be derived from the scattering-based formalism by an appropriate choice of projection. Within the effective medium limit, it is observed that a simple semianalytic modeling technique based on the effective impedance can be used to reliably compute the reflection coefficients of metamaterials over a wide range of incidence angles. We use this technique to model planar metamaterial waveguides or surface modes.	en_US
dc.relation	http://purl.org/au-research/grants/arc/CE110001018
dc.relation.ispartof	Journal of the Optical Society of America A: Optics and Image Science, and Vision	en_US
dc.relation.isbasedon	10.1364/JOSAA.33.000361	en_US
dc.rights	© 2016 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.	en_US
dc.subject.classification	Optics	en_US
dc.title	Effective impedance modeling of metamaterial structures	en_US
dc.type	Journal Article
utslib.citation.volume	3	en_US
utslib.citation.volume	33	en_US
utslib.for	0105 Mathematical Physics	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
utslib.for	1113 Opthalmology and Optometry	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	open_access
pubs.issue	3	en_US
pubs.publication-status	Published	en_US
pubs.volume	33	en_US

Abstract:

© 2016 Optical Society of America. We present methods for retrieving the effective impedance of metamaterials from the Fresnel reflection coefficients at the interface between two semi-infinite media. The derivation involves the projection of rigorous modal expansions onto the dominant modes of the two semi-infinite media. It is shown that the effective impedance can also be written as a ratio of averaged field quantities. Thus, a number of effective impedance formulas, previously obtained by field averaging techniques, can also be derived from the scattering-based formalism by an appropriate choice of projection. Within the effective medium limit, it is observed that a simple semianalytic modeling technique based on the effective impedance can be used to reliably compute the reflection coefficients of metamaterials over a wide range of incidence angles. We use this technique to model planar metamaterial waveguides or surface modes.

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http://hdl.handle.net/10453/47676