X-ray mapping and interpretation of scatter diagrams

Springer Wien
Publication Type:
Journal Article
Microchimica Acta, 2006, 155 (1-2), pp. 209 - 217
Issue Date:
Full metadata record
Files in This Item:
Filename Description Size
Thumbnail2006004104.pdf705.18 kB
Adobe PDF
Electron beam induced quantitative X-ray mapping has become a very useful characterisation tool for determining the elemental distribution in materials, whether using energy dispersive spectroscopy or wavelength dispersive spectroscopy. The X-ray intensi
Please use this identifier to cite or link to this item: