Bayesian inference of nanoparticle-broadened x-ray line profiles

Publication Type:
Journal Article
Citation:
Journal of Research of the National Institute of Standards and Technology, 2004, 109 (1), pp. 155 - 178
Issue Date:
2004-01-01
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A single-step, self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. It is shown that the crystallite-size distribution can be determined without invoking a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO2data, the results comparing favourably with experimental CeO2data from TEM measurements.
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