Bayesian inference of nanoparticle-broadened x-ray line profiles
- Publication Type:
- Journal Article
- Journal of Research of the National Institute of Standards and Technology, 2004, 109 (1), pp. 155 - 178
- Issue Date:
A single-step, self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. It is shown that the crystallite-size distribution can be determined without invoking a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO2 data, the results comparing favourably with experimental CeO2 data from TEM measurements.
Please use this identifier to cite or link to this item: