Bayesian analysis of ceria nanoparticles from line profile data

International Centre for Diffraction Data
Publication Type:
Conference Proceeding
Advances in X-ray analysis - Volume 48, 2005, pp. 59 - 66
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A Bayesian/Maximum entropy (MaxEnt) emthod is applied to quantify the broadening of X-ray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreemetn with transmission electron microscopy results, while demonstrating the importance of appropriate a priori information needed in the method. The analysis also identifies other microstructural effects, such as the presence of dislocations and shape anisotropic effects which may be influencing the size distributions determined from the Bayesian/Max-Ent method.
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