Radiation modes and roughness loss in high index-contrast waveguides

Poulton, CG; Koos, C; Fujii, M; Pfrang, A; Schimmel, T; Leuthold, J; Freude, W

Radiation modes and roughness loss in high index-contrast waveguides

Poulton, CG

Koos, C Fujii, M Pfrang, A Schimmel, T Leuthold, J Freude, W

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Publication Type:: Journal Article
Citation:: IEEE Journal on Selected Topics in Quantum Electronics, 2006, 12 (6), pp. 1306 - 1320
Issue Date:: 2006-11-01

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Field	Value	Language
dc.contributor.author	Poulton, CG https://orcid.org/0000-0002-2707-3424	en_US
dc.contributor.author	Koos, C	en_US
dc.contributor.author	Fujii, M	en_US
dc.contributor.author	Pfrang, A	en_US
dc.contributor.author	Schimmel, T	en_US
dc.contributor.author	Leuthold, J	en_US
dc.contributor.author	Freude, W	en_US
dc.date.issued	2006-11-01	en_US
dc.identifier.citation	IEEE Journal on Selected Topics in Quantum Electronics, 2006, 12 (6), pp. 1306 - 1320	en_US
dc.identifier.issn	1077-260X	en_US
dc.identifier.uri	http://hdl.handle.net/10453/717
dc.description.abstract	We predict the scattering loss in rectangular high index-contrast waveguides, using a new variation of the classical approach of coupled-mode theory. The loss predicted by this three-dimensional (3-D) model is considerably larger than that calculated using previous treatments that approximate the true 3-D radiation modes with their two-dimensional counterparts. The 3-D radiation modes of the ideal waveguide are expanded in a series of cylindrical harmonics, and the coupling between the guided and radiation modes due to the sidewall perturbation is computed. The waveguide attenuation can then be calculated semianalytically. It is found that the dominant loss mechanism is radiation rather than reflection, and that the transverse electric polarization exhibits much larger attenuation than transverse magnetic polarization. The method also gives simple rules that can be used in the design of low-loss optical waveguides. The structural properties of sidewall roughness of an InGaAs/InP pedestal waveguide are measured using atomic force microscopy, and the measured attenuation is found to compare well with that predicted by the model. © 2006 IEEE.	en_US
dc.relation.ispartof	IEEE Journal on Selected Topics in Quantum Electronics	en_US
dc.relation.isbasedon	10.1109/JSTQE.2006.881648	en_US
dc.subject.classification	Optoelectronics & Photonics	en_US
dc.title	Radiation modes and roughness loss in high index-contrast waveguides	en_US
dc.type	Journal Article
utslib.citation.volume	6	en_US
utslib.citation.volume	12	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0206 Quantum Physics	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	closed_access
pubs.issue	6	en_US
pubs.publication-status	Published	en_US
pubs.volume	12	en_US

Abstract:

We predict the scattering loss in rectangular high index-contrast waveguides, using a new variation of the classical approach of coupled-mode theory. The loss predicted by this three-dimensional (3-D) model is considerably larger than that calculated using previous treatments that approximate the true 3-D radiation modes with their two-dimensional counterparts. The 3-D radiation modes of the ideal waveguide are expanded in a series of cylindrical harmonics, and the coupling between the guided and radiation modes due to the sidewall perturbation is computed. The waveguide attenuation can then be calculated semianalytically. It is found that the dominant loss mechanism is radiation rather than reflection, and that the transverse electric polarization exhibits much larger attenuation than transverse magnetic polarization. The method also gives simple rules that can be used in the design of low-loss optical waveguides. The structural properties of sidewall roughness of an InGaAs/InP pedestal waveguide are measured using atomic force microscopy, and the measured attenuation is found to compare well with that predicted by the model. © 2006 IEEE.

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http://hdl.handle.net/10453/717