The 1s-State Analysis Applied to High-Angle, Annular Dark-Field Image Interpretation - When Can We Use It?

Anstis, GR

The 1s-State Analysis Applied to High-Angle, Annular Dark-Field Image Interpretation - When Can We Use It?

Anstis, GR

Permalink

Publication Type:: Journal Article
Citation:: Microscopy and Microanalysis, 2004, 10 (1), pp. 4 - 8
Issue Date:: 2004-02-01

Open Access

Copyright Clearance Process

Recently Added
In Progress
Open Access

This item is open access.

Adobe PDF

Download full textAdobe PDF (467.12 kB)

View on publisher's site

View statistics

Full metadata record

Field	Value	Language
dc.contributor.author	Anstis, GR	en_US
dc.date.issued	2004-02-01	en_US
dc.identifier.citation	Microscopy and Microanalysis, 2004, 10 (1), pp. 4 - 8	en_US
dc.identifier.issn	1431-9276	en_US
dc.identifier.uri	http://hdl.handle.net/10453/755
dc.description.abstract	A small probe centered on an atomic column excites the bound and unbound states of the two-dimensional projected potential of the column. It has been argued that, even when several states are excited, only the 1s state is sufficiently localized to contribute a signal to the high-angle detector. This article shows that non-1s states do make a significant contribution for certain incident probe profiles. The contribution of the 1s state to the thermal diffuse scattering is calculated directly. Sub-Ångstrom probes formed by Cs-corrected lenses excite predominantly the 1s state and contributions from other states are not very large. For probes of lower resolution when non-1s states are important, the integrated electron intensity at the column provides a better estimate of image intensity.	en_US
dc.relation.ispartof	Microscopy and Microanalysis	en_US
dc.relation.isbasedon	10.1017/S1431927604040255	en_US
dc.subject.classification	Microscopy	en_US
dc.subject.mesh	Microscopy, Electron, Scanning Transmission	en_US
dc.subject.mesh	Monte Carlo Method	en_US
dc.subject.mesh	Scattering, Radiation	en_US
dc.subject.mesh	Models, Theoretical	en_US
dc.subject.mesh	Image Processing, Computer-Assisted	en_US
dc.title	The 1s-State Analysis Applied to High-Angle, Annular Dark-Field Image Interpretation - When Can We Use It?	en_US
dc.type	Journal Article
utslib.citation.volume	1	en_US
utslib.citation.volume	10	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0204 Condensed Matter Physics	en_US
utslib.for	0601 Biochemistry and Cell Biology	en_US
utslib.for	0912 Materials Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	open_access
pubs.issue	1	en_US
pubs.publication-status	Published	en_US
pubs.volume	10	en_US

Abstract:

A small probe centered on an atomic column excites the bound and unbound states of the two-dimensional projected potential of the column. It has been argued that, even when several states are excited, only the 1s state is sufficiently localized to contribute a signal to the high-angle detector. This article shows that non-1s states do make a significant contribution for certain incident probe profiles. The contribution of the 1s state to the thermal diffuse scattering is calculated directly. Sub-Ångstrom probes formed by Cs-corrected lenses excite predominantly the 1s state and contributions from other states are not very large. For probes of lower resolution when non-1s states are important, the integrated electron intensity at the column provides a better estimate of image intensity.

Please use this identifier to cite or link to this item:

http://hdl.handle.net/10453/755