Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving

Cambridge University Press
Publication Type:
Journal Article
Microscopy & Microanalysis, 2008, 14 (S2), pp. 1108 - 1109
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X-ray mapping with Silicon Drift detectors (SDDs) and multi-EDS detector systems has become an invaluable analysis technique because the time to perform an x-ray map is reduced considerably. Live x-ray imaging can now been performed with so much data collected in a matter of minutes. The use of multi-EDS detector systems has made this form of mapping even quicker and has also given users the ability to map minor and trace elements very accurately. How the data is collected and summed with multi-EDS detectors is very critical for accurate quantitative x-ray mapping (QXRM).
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