An improved transfer-matrix model for optical superlenses

Moore, CP; Blaikie, RJ; Arnold, MD

An improved transfer-matrix model for optical superlenses

Moore, CP Blaikie, RJ Arnold, MD

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Publication Type:: Journal Article
Citation:: Optics Express, 2009, 17 (16), pp. 14260 - 14269
Issue Date:: 2009-08-03

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Field	Value	Language
dc.contributor.author	Moore, CP	en_US
dc.contributor.author	Blaikie, RJ	en_US
dc.contributor.author	Arnold, MD https://orcid.org/0000-0003-4164-0242	en_US
dc.date.issued	2009-08-03	en_US
dc.identifier.citation	Optics Express, 2009, 17 (16), pp. 14260 - 14269	en_US
dc.identifier.uri	http://hdl.handle.net/10453/9471
dc.description.abstract	The use of transfer-matrix analyses for characterizing planar optical superlensing systems is studied here, and the simple model of the planar superlens as an isolated imaging element is shown to be defective in certain situations. These defects arise due to neglected interactions between the superlens and the spatially varying shadow masks that are normally used as scattering objects for imaging, and which are held in near-field proximity to the superlenses. An extended model is proposed that improves the accuracy of the transfer-matrix analysis, without adding significant complexity, by approximating the reflections from the shadow mask by those from a uniform metal layer. Results obtained using both forms of the transfer matrix model are compared to finite element models and two example superlenses, one with a silver monolayer and the other with three silver sublayers, are characterized. The modified transfer matrix model gives much better agreement in both cases. © 2009 Optical Society of America.	en_US
dc.relation.ispartof	Optics Express	en_US
dc.relation.isbasedon	10.1364/OE.17.014260	en_US
dc.rights	© 2009 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.	en_US
dc.subject.classification	Optics	en_US
dc.subject.mesh	Equipment Design	en_US
dc.subject.mesh	Equipment Failure Analysis	en_US
dc.subject.mesh	Lenses	en_US
dc.subject.mesh	Algorithms	en_US
dc.subject.mesh	Light	en_US
dc.subject.mesh	Scattering, Radiation	en_US
dc.subject.mesh	Models, Theoretical	en_US
dc.subject.mesh	Computer-Aided Design	en_US
dc.subject.mesh	Computer Simulation	en_US
dc.title	An improved transfer-matrix model for optical superlenses	en_US
dc.type	Journal Article
utslib.citation.volume	16	en_US
utslib.citation.volume	17	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
utslib.for	1005 Communications Technologies	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	open_access
pubs.issue	16	en_US
pubs.publication-status	Published	en_US
pubs.volume	17	en_US

Abstract:

The use of transfer-matrix analyses for characterizing planar optical superlensing systems is studied here, and the simple model of the planar superlens as an isolated imaging element is shown to be defective in certain situations. These defects arise due to neglected interactions between the superlens and the spatially varying shadow masks that are normally used as scattering objects for imaging, and which are held in near-field proximity to the superlenses. An extended model is proposed that improves the accuracy of the transfer-matrix analysis, without adding significant complexity, by approximating the reflections from the shadow mask by those from a uniform metal layer. Results obtained using both forms of the transfer matrix model are compared to finite element models and two example superlenses, one with a silver monolayer and the other with three silver sublayers, are characterized. The modified transfer matrix model gives much better agreement in both cases. © 2009 Optical Society of America.

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http://hdl.handle.net/10453/9471