Deep Learning Applications with Practical Measured Results in Electronics Industries

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Field	Value	Language
dc.contributor.editor	Horng, M-F
dc.contributor.editor	Kung, H-Y
dc.contributor.editor	Chen, C-H
dc.contributor.editor	Hwang, FJ
dc.date.accessioned	2021-11-04T04:53:02Z
dc.date.available	2021-11-04T04:53:02Z
dc.date.issued	2020-05
dc.identifier.citation	2020
dc.identifier.isbn	978-3-03928-863-2
dc.identifier.uri	http://hdl.handle.net/10453/151339
dc.language	en
dc.publisher	Multidisciplinary Digital Publishing Institute
dc.rights	info:eu-repo/semantics/restrictedAccess
dc.rights	©2020 by the authors. Articles in this book are Open Access and distributed under the Creative Commons Attribution (CC BY) license, which allows users to download, copy and build upon published articles, as long as the author and publisher are properly credited, which ensures maximum dissemination and a wider impact of our publications. The book as a whole is distributed by MDPI under the terms and conditions of the Creative Commons license CC BY-NC-ND.
dc.title	Deep Learning Applications with Practical Measured Results in Electronics Industries
dc.type	Edited Book
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	recently_added	*
pubs.consider-herdc	true
dc.date.updated	2021-11-04T04:44:08Z
pubs.place-of-publication	Basel, Switzerland
pubs.publication-status	Published
dc.location	Basel, Switzerland

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